| |
| 2002 | ||
|---|---|---|
| 1 | EE | Kinuko Mishiro, Shigeo Ishikawa, Mitsunori Abe, Toshio Kumai, Yutaka Higashiguchi, Ken-ichiro Tsubone: Effect of the drop impact on BGA/CSP package reliability. Microelectronics Reliability 42(1): 77-82 (2002) |
| 1 | Mitsunori Abe | [1] |
| 2 | Shigeo Ishikawa | [1] |
| 3 | Toshio Kumai | [1] |
| 4 | Kinuko Mishiro | [1] |
| 5 | Ken-ichiro Tsubone | [1] |