David Haupert
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1989
1
David Haupert,
Fu-Gin Chen
,
David Lee
: VLSI Package Reliability Risk Due to Accelerated Environmental Testing.
ITC 1989
: 938
Coauthor
Index
1
Fu-Gin Chen
[
1
]
2
David Lee
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
