| |
| 2001 | ||
|---|---|---|
| 1 | EE | T. Mikolajick, C. Dehm, W. Hartner, I. Kasko, M. J. Kastner, N. Nagel, M. Moert, C. Mazure: FeRAM technology for high density applications. Microelectronics Reliability 41(7): 947-950 (2001) |
| 1 | C. Dehm | [1] |
| 2 | I. Kasko | [1] |
| 3 | M. J. Kastner | [1] |
| 4 | C. Mazure | [1] |
| 5 | T. Mikolajick | [1] |
| 6 | M. Moert | [1] |
| 7 | N. Nagel | [1] |