Kim Harper
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1997
1
Minh Quach
, Kim Harper: Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process.
ITC 1997
: 802-808
Coauthor
Index
1
Minh Quach
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
