Hisayoshi Hanai

2001
1	EE	Hisayoshi Hanai, Shinji Yamada, Hisaya Mori, Eisaku Yamashita, Teruhiko Funakura: Built-out Self-Test (BOST) for Analog Circuits in a System LSI: Test Solution to Reduce Test Costs. Asian Test Symposium 2001: 460

Coauthor Index

1	Teruhiko Funakura	[1]
2	Hisaya Mori	[1]
3	Shinji Yamada	[1]
4	Eisaku Yamashita	[1]