Nazar S. Haider
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1993
1
EE
Nazar S. Haider,
Nick Kanopoulos
: Efficient board interconnect testing using the split boundary scan register.
J. Electronic Testing 4
(2): 181-189 (1993)
Coauthor
Index
1
Nick Kanopoulos
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
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