| |
| 2003 | ||
|---|---|---|
| 1 | EE | François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra: Low frequency noise in 0.12 mum partially and fully depleted SOI technology. Microelectronics Reliability 43(2): 243-248 (2003) |
| 1 | Francis Balestra | [1] |
| 2 | François Dieudonné | [1] |
| 3 | Jalal Jomaah | [1] |