Steven Haehn
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1997
1
EE
Steven Haehn,
T. S. Kalkur
: Failure Analysis of VLSI by I
DDQ
Testing.
J. Electronic Testing 11
(3): 273-283 (1997)
Coauthor
Index
1
T. S. Kalkur
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
