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W. Härtel

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1981
1EEJ. W. Betz, G. V. Sengbusch, W. Härtel: Low resolution slit-scan pattern recognition applying one-dimensional multiparameter analysis. Pattern Recognition 13(1): 89-93 (1981)

Coauthor Index

1J. W. Betz [1]
2G. V. Sengbusch [1]

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