J. W. Betz
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1981
1
EE
J. W. Betz,
G. V. Sengbusch
,
W. Härtel
: Low resolution slit-scan pattern recognition applying one-dimensional multiparameter analysis.
Pattern Recognition 13
(1): 89-93 (1981)
Coauthor
Index
1
W. Härtel
[
1
]
2
G. V. Sengbusch
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
