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| 2002 | ||
|---|---|---|
| 1 | EE | Hu Guijun, Shi Jiawei, Zhang Shumei, Zhang Fenggang: The correlation between the low-frequency electrical noise of high-power quantum well lasers and devices surface non-radiative current. Microelectronics Reliability 42(1): 153-156 (2002) |
| 1 | Zhang Fenggang | [1] |
| 2 | Shi Jiawei | [1] |
| 3 | Zhang Shumei | [1] |