Nihal J. Godambe

1998
2	EE	Nihal J. Godambe, C.-J. Richard Shi: Behavioral Level Noise Modeling and Jitter Simulation of Phase-Locked Loops with Faults Using VHDL-AMS. J. Electronic Testing 13(1): 7-17 (1998)
1997
1	EE	Nihal J. Godambe, C.-J. Richard Shi: Behavioral level noise modeling and jitter simulation of phase-locked loops with faults using VHDL-AMS. VTS 1997: 177-183

Coauthor Index

1

C.-J. Richard Shi

[1] [2]