Thomas Gibson
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2002
1
EE
Jocelyn Siplon
,
Gary J. Ewell
, Thomas Gibson: ESR concerns in tantalum chip capacitors exposed to non-oxygen-containing environments.
Microelectronics Reliability 42
(6): 829-834 (2002)
Coauthor
Index
1
Gary J. Ewell
[
1
]
2
Jocelyn Siplon
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
