X. Garros

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2001

1 N. Revil, X. Garros: Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications. Microelectronics Reliability 41(9-10): 1307-1312 (2001)

2001
1		N. Revil, X. Garros: Hot-Carrier Reliability for Si and SiGe HBTs: Aging Procedure, Extrapolation Model Limitations and Applications. Microelectronics Reliability 41(9-10): 1307-1312 (2001)

Coauthor Index

1 N. Revil [1]