S. Gamerith

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2002

1 EE S. Gamerith, M. Pölzl: Negative bias temperature stress on low voltage p-channel DMOS transistors and the role of nitrogen. Microelectronics Reliability 42(9-11): 1439-1443 (2002)

2002
1	EE	S. Gamerith, M. Pölzl: Negative bias temperature stress on low voltage p-channel DMOS transistors and the role of nitrogen. Microelectronics Reliability 42(9-11): 1439-1443 (2002)

Coauthor Index

1 M. Pölzl [1]