S. G. From

List of publications from the DBLP Bibliography Server - FAQ

1993

1 EE H. A. Farhat, S. G. From: A beta model for estimating the testability and coverage distributions of a VLSI circuit. IEEE Trans. on CAD of Integrated Circuits and Systems 12(4): 550-554 (1993)

1993
1	EE	H. A. Farhat, S. G. From: A beta model for estimating the testability and coverage distributions of a VLSI circuit. IEEE Trans. on CAD of Integrated Circuits and Systems 12(4): 550-554 (1993)

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