H. A. Farhat
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1993
1
EE
H. A. Farhat,
S. G. From
: A beta model for estimating the testability and coverage distributions of a VLSI circuit.
IEEE Trans. on CAD of Integrated Circuits and Systems 12
(4): 550-554 (1993)
Coauthor
Index
1
S. G. From
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)