R. France
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1984
1
D. Leet
,
P. Shearon
, R. France: A CMOS LSSD Test Generation System.
IBM Journal of Research and Development 28
(5): 625-635 (1984)
Coauthor
Index
1
D. Leet
[
1
]
2
P. Shearon
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
