| |
| 2003 | ||
|---|---|---|
| 1 | EE | B. Alpat, R. Battiston, M. Bizzarri, D. Caraffini, E. Fiori, A. Papi, M. Petasecca, A. Pontetti: The radiation sensitivity mapping of ICs using an IR pulsed laser system. Microelectronics Reliability 43(6): 981-984 (2003) |
| 1 | B. Alpat | [1] |
| 2 | R. Battiston | [1] |
| 3 | M. Bizzarri | [1] |
| 4 | D. Caraffini | [1] |
| 5 | A. Papi | [1] |
| 6 | M. Petasecca | [1] |
| 7 | A. Pontetti | [1] |