Julian Fierro
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1998
1
EE
Mukund R. Patel
, Julian Fierro,
Steve Pico
: IDDQ Test Methodology and Tradeoffs for Scan/Non-Scan Designs.
Asian Test Symposium 1998
: 138-143
Coauthor
Index
1
Mukund R. Patel
[
1
]
2
Steve Pico
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
