R. Falster
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2001
1
EE
R. Falster,
F. Bonoli
,
V. V. Voronkov
: Dielectric breakdown distributions for void containing silicon substrates.
Microelectronics Reliability 41
(7): 967-971 (2001)
Coauthor
Index
1
F. Bonoli
[
1
]
2
V. V. Voronkov
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
