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2007 | ||
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3 | EE | M. A. El-Gamal, M. D. A. Mohamed: Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits. J. Electronic Testing 23(4): 323-339 (2007) |
2002 | ||
2 | EE | M. A. El-Gamal: Genetically Evolved Neural Networks for Fault Classification in Analog Circuits. Neural Computing and Applications 11(2): 112-121 (2002) |
1999 | ||
1 | EE | M. A. El-Gamal, M. F. Abu El-Yazeed: A Combined Clustering and Neural Network Approach for Analog Multiple Hard Fault Classification. J. Electronic Testing 14(3): 207-217 (1999) |
1 | M. F. Abu El-Yazeed | [1] |
2 | M. D. A. Mohamed | [3] |