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M. A. El-Gamal

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2007
3EEM. A. El-Gamal, M. D. A. Mohamed: Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits. J. Electronic Testing 23(4): 323-339 (2007)
2002
2EEM. A. El-Gamal: Genetically Evolved Neural Networks for Fault Classification in Analog Circuits. Neural Computing and Applications 11(2): 112-121 (2002)
1999
1EEM. A. El-Gamal, M. F. Abu El-Yazeed: A Combined Clustering and Neural Network Approach for Analog Multiple Hard Fault Classification. J. Electronic Testing 14(3): 207-217 (1999)

Coauthor Index

1M. F. Abu El-Yazeed [1]
2M. D. A. Mohamed [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)