M. F. Abu El-Yazeed

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1999

1 EE M. A. El-Gamal, M. F. Abu El-Yazeed: A Combined Clustering and Neural Network Approach for Analog Multiple Hard Fault Classification. J. Electronic Testing 14(3): 207-217 (1999)

1999
1	EE	M. A. El-Gamal, M. F. Abu El-Yazeed: A Combined Clustering and Neural Network Approach for Analog Multiple Hard Fault Classification. J. Electronic Testing 14(3): 207-217 (1999)

Coauthor Index

1 M. A. El-Gamal [1]