| |
| 2005 | ||
|---|---|---|
| 2 | EE | Dongwoo Hong, Cameron Dryden, Gordon Saksena: An Efficient Random Jitter Measurement Technique Using Fast Comparator Sampling. VTS 2005: 123-130 |
| 1 | EE | Cameron Dryden: Survey of Design and Process Failure Modes for High-Speed SerDes in Nanometer CMOS. VTS 2005: 285-291 |
| 1 | Dongwoo Hong | [2] |
| 2 | Gordon Saksena | [2] |