2006 | ||
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1 | EE | Cheng-Li Chuang, Jong-Ning Aoh, Rong-Fong Din: Oxidation of copper pads and its influence on the quality of Au/Cu bonds during thermosonic wire bonding process. Microelectronics Reliability 46(2-4): 449-458 (2006) |
1 | Jong-Ning Aoh | [1] |
2 | Cheng-Li Chuang | [1] |