Chih-Kang Deng
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2006
1
EE
Chih-Kang Deng,
Ming-Dou Ker
: ESD robustness of thin-film devices with different layout structures in LTPS technology.
Microelectronics Reliability 46
(12): 2067-2073 (2006)
Coauthor
Index
1
Ming-Dou Ker
[
1
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Sun May 17 03:24:02 2009 by
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ley@uni-trier.de
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