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Chih-Kang Deng

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2006
1EEChih-Kang Deng, Ming-Dou Ker: ESD robustness of thin-film devices with different layout structures in LTPS technology. Microelectronics Reliability 46(12): 2067-2073 (2006)

Coauthor Index

1Ming-Dou Ker [1]

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