1997 | ||
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3 | EE | K. De: Test methodology for embedded cores which protects intellectual property. VTS 1997: 2-9 |
1994 | ||
2 | EE | K. De, C. Natarajan, D. Nair, P. Banerjee: RSYN: a system for automated synthesis of reliable multilevel circuits. IEEE Trans. VLSI Syst. 2(2): 186-195 (1994) |
1993 | ||
1 | EE | K. De, P. Banerjee: PREST: a system for logic partitioning and resynthesis for testability. IEEE Trans. VLSI Syst. 1(4): 514-525 (1993) |
1 | P. Banerjee | [1] [2] |
2 | D. Nair | [2] |
3 | C. Natarajan | [2] |