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| 2002 | ||
|---|---|---|
| 1 | EE | G. Curro, R. Greco, A. Scandurra: Growth process and chemical characterization of an ultrathin phosphate film grafted onto Al-alloy metallization surfaces relevant to microelectronic devices reliability. Microelectronics Reliability 42(9-11): 1659-1662 (2002) |
| 1 | R. Greco | [1] |
| 2 | A. Scandurra | [1] |