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| 2005 | ||
|---|---|---|
| 1 | EE | E. Spitale, D. Corso, I. Crupi, S. Lombardo, C. Gerardi: Improvement of the P/E window in nanocrystal memories by the use of high-k materials in the control dielectric. Microelectronics Reliability 45(5-6): 895-898 (2005) |
| 1 | D. Corso | [1] |
| 2 | C. Gerardi | [1] |
| 3 | S. Lombardo | [1] |
| 4 | E. Spitale | [1] |