Peter Cox
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2001
1
EE
Anton Chichkov
,
Dirk Merlier
, Peter Cox: Current Testing Procedure for Deep Submicron Devices.
J. Electronic Testing 17
(3-4): 219-224 (2001)
Coauthor
Index
1
Anton Chichkov
[
1
]
2
Dirk Merlier
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
