| |
| 2001 | ||
|---|---|---|
| 1 | EE | X. Tang, X. Baie, J. P. Colinge, P. Loumaye, C. Renaux, V. Bayot: Influence of device geometry on SOI single-hole transistor characteristics. Microelectronics Reliability 41(11): 1841-1846 (2001) |
| 1 | X. Baie | [1] |
| 2 | V. Bayot | [1] |
| 3 | P. Loumaye | [1] |
| 4 | C. Renaux | [1] |
| 5 | X. Tang | [1] |