| |
| 1989 | ||
|---|---|---|
| 3 | EE | Mehmet A. Cirit: The Meyer model revisited: why is charge not conserved? [MOS transistor]. IEEE Trans. on CAD of Integrated Circuits and Systems 8(10): 1033-1037 (1989) |
| 1988 | ||
| 2 | EE | Mehmet A. Cirit: Switch Level Random Pattern Testability Analysis. DAC 1988: 587-590 |
| 1987 | ||
| 1 | EE | Mehmet A. Cirit: Transistor Sizing in CMOS Circuits. DAC 1987: 121-124 |