Xu Chunmei
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2008
1
EE
Liu Changhui
, Xu Chunmei,
Liu Le
,
He Huahui
: Measure the Thickness of the Thin-Film Single-Slice-Capacitor.
ISIP 2008
: 770-773
Coauthor
Index
1
Liu Changhui
[
1
]
2
He Huahui
[
1
]
3
Liu Le
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
