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Liu Changhui

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2008
1EELiu Changhui, Xu Chunmei, Liu Le, He Huahui: Measure the Thickness of the Thin-Film Single-Slice-Capacitor. ISIP 2008: 770-773

Coauthor Index

1Xu Chunmei [1]
2He Huahui [1]
3Liu Le [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)