Young S. Chung
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2002
1
EE
Young S. Chung,
Bob Baird
: Power capability limits of power MOSFET devices.
Microelectronics Reliability 42
(2): 211-218 (2002)
Coauthor
Index
1
Bob Baird
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
