Kyoung Youn Cho
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2007
1
EE
Kyoung Youn Cho,
Edward J. McCluskey
: Test Set Reordering Using the Gate Exhaustive Test Metric.
VTS 2007
: 199-204
Coauthor
Index
1
Edward J. McCluskey
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
