1987 | ||
---|---|---|
3 | Cary K. Chin, Edward J. McCluskey: Test Length for Pseudorandom Testing. IEEE Trans. Computers 36(2): 252-256 (1987) | |
2 | Kenneth D. Wagner, Cary K. Chin, Edward J. McCluskey: Pseudorandom Testing. IEEE Trans. Computers 36(3): 332-343 (1987) | |
1985 | ||
1 | Cary K. Chin, Edward J. McCluskey: Test Length for Pseudo Random Testing. ITC 1985: 94-99 |
1 | Edward J. McCluskey | [1] [2] [3] |
2 | Kenneth D. Wagner | [2] |