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Cary K. Chin

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1987
3 Cary K. Chin, Edward J. McCluskey: Test Length for Pseudorandom Testing. IEEE Trans. Computers 36(2): 252-256 (1987)
2 Kenneth D. Wagner, Cary K. Chin, Edward J. McCluskey: Pseudorandom Testing. IEEE Trans. Computers 36(3): 332-343 (1987)
1985
1 Cary K. Chin, Edward J. McCluskey: Test Length for Pseudo Random Testing. ITC 1985: 94-99

Coauthor Index

1Edward J. McCluskey [1] [2] [3]
2Kenneth D. Wagner [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)