2007 |
13 | EE | Zezhi Chen,
Andrew M. Wallace:
Improved Object Tracking Using an Adaptive Colour Model.
EMMCVPR 2007: 280-294 |
12 | EE | Zezhi Chen,
Zsolt L. Husz,
Iain Wallace,
Andrew M. Wallace:
Video Object Tracking Based on a Chamfer Distance Transform.
ICIP (3) 2007: 357-360 |
11 | EE | Armelle Bonenfant,
Zezhi Chen,
Kevin Hammond,
Greg Michaelson,
Andrew M. Wallace,
Iain Wallace:
Towards resource-certified software: a formal cost model for time and its application to an image-processing example.
SAC 2007: 1307-1314 |
2006 |
10 | EE | Zezhi Chen,
Nick Pears,
Bojian Liang:
Monocular obstacle detection using reciprocal-polar rectification.
Image Vision Comput. 24(12): 1301-1312 (2006) |
9 | EE | Zezhi Chen,
Nick Pears,
Bojian Liang:
A method of visual metrology from uncalibrated images.
Pattern Recognition Letters 27(13): 1447-1456 (2006) |
2004 |
8 | EE | Zezhi Chen,
Nick E. Pears,
Bojian Liang,
John McDermid:
Plane Segmentation from Two Views in Reciprocal-Polar Image Space.
ICIAR (1) 2004: 638-646 |
7 | EE | Bojian Liang,
Zezhi Chen,
Nick Pears:
Uncalibrated Two-View Metrology.
ICPR (1) 2004: 96-99 |
6 | EE | Zezhi Chen,
Chengke Wu,
Yong Liu,
Nick Pears:
3d Euclidean Reconstruction of Buildings from Uncalibrated Image Sequences.
International Journal of Shape Modeling 10(1): 115-132 (2004) |
2003 |
5 | EE | Thomas Heseltine,
Nick Pears,
Jim Austin,
Zezhi Chen:
Face Recognition: A Comparison of Appearance-Based Approaches.
DICTA 2003: 59-68 |
4 | EE | Zezhi Chen,
Nick Pears,
John McDermid,
Thomas Heseltine:
Epipole Estimation under Pure Camera Translation.
DICTA 2003: 849-858 |
3 | EE | Zezhi Chen,
Chengke Wu,
Hung-Tat Tsui:
A new image rectification algorithm.
Pattern Recognition Letters 24(1-3): 251-260 (2003) |
2002 |
2 | EE | Li Tang,
Chengke Wu,
Zezhi Chen:
Image dense matching based on region growth with adaptive window.
Pattern Recognition Letters 23(10): 1169-1178 (2002) |
2000 |
1 | EE | Zezhi Chen,
Chengke Wu,
Peiyi Shen,
Yong Liu,
Long Quan:
A robust algorithm to estimate the fundamental matrix.
Pattern Recognition Letters 21(9): 851-861 (2000) |