1987 | ||
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2 | EE | Ihao Chen, Andrzej J. Strojwas: A Methodology for Optimal Test Structure Design for Statistical Process Characterization and Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems 6(4): 592-600 (1987) |
1 | EE | Ihao Chen, Andrzej J. Strojwas: Realistic Yield Simulation for VLSIC Structural Failures. IEEE Trans. on CAD of Integrated Circuits and Systems 6(6): 965-980 (1987) |
1 | Andrzej J. Strojwas | [1] [2] |