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Ihao Chen

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1987
2EEIhao Chen, Andrzej J. Strojwas: A Methodology for Optimal Test Structure Design for Statistical Process Characterization and Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems 6(4): 592-600 (1987)
1EEIhao Chen, Andrzej J. Strojwas: Realistic Yield Simulation for VLSIC Structural Failures. IEEE Trans. on CAD of Integrated Circuits and Systems 6(6): 965-980 (1987)

Coauthor Index

1Andrzej J. Strojwas [1] [2]

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