2006 | ||
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1 | EE | S. Charruau, F. Guerin, J. Hernández Dominguez, J. Berthon: Reliability estimation of aeronautic component by accelerated tests. Microelectronics Reliability 46(9-11): 1451-1457 (2006) |
1 | J. Berthon | [1] |
2 | J. Hernández Dominguez | [1] |
3 | F. Guerin | [1] |