2008 |
10 | EE | Robert Geldhill,
Sarah Kent,
Andrew J. Milsted,
Richard Chapman,
Jonathan W. Essex,
Jeremy G. Frey:
e-Malaria: the schools Malaria project.
Concurrency and Computation: Practice and Experience 20(3): 225-238 (2008) |
2007 |
9 | EE | Richard Chapman,
J. A. Drew Hamilton Jr.,
Daniel Box,
Mark Kuhr,
Jonathan MacDonald,
Stephen Hamilton:
Simulation of army unmanned aerial vehicle communications.
Winter Simulation Conference 2007: 1324-1327 |
2000 |
8 | EE | Ryan Brooks,
Homer Carlisle,
Richard Chapman,
Amos Confer,
Kaushik Lahoti,
Missam Momin,
Neal Rogers,
Ruslana Svidzinksa,
Bindu Vrishabhendra:
A Jini-enabled active badge system.
ACM Southeast Regional Conference 2000: 105-106 |
7 | EE | Jacqueline Moore,
Richard Chapman,
Gerry Dozier:
Multiobjective particle swarm optimization.
ACM Southeast Regional Conference 2000: 56-57 |
6 | | Kai H. Chang,
Shih-Sung Liao,
Richard Chapman,
Chun-Yu Chen:
Test Scenario Generation Based on Formal Specification and Usage Profile.
International Journal of Software Engineering and Knowledge Engineering 10(2): 185-201 (2000) |
1999 |
5 | EE | Chun-Yu Chen,
Richard Chapman,
Kai H. Chang:
Test scenario and regression test suite generation from Object-Z formal specification for object-oriented program testing.
ACM Southeast Regional Conference 1999 |
1998 |
4 | | Carolyn McCreary,
Richard Chapman,
Fwu-Shan Shieh:
Using graph parsing for automatic graph drawing.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 28(5): 545-561 (1998) |
3 | EE | Kai H. Chang,
Shih-Sung Liao,
Stephen B. Seidman,
Richard Chapman:
Testing object-oriented programs: from formal specification to test scenario generation.
Journal of Systems and Software 42(2): 141-151 (1998) |
1993 |
2 | EE | Miriam Leeser,
Richard Chapman,
Mark Aagaard,
Mark H. Linderman,
Stephan Meier:
High level synthesis and generating FPGAs with the BEDROC system.
VLSI Signal Processing 6(2): 191-214 (1993) |
1990 |
1 | | Tim Teitelbaum,
Richard Chapman:
Higher-Order Attribute Grammars and Editing Environments.
PLDI 1990: 197-208 |