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1991 | ||
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3 | EE | Susheel J. Chandra, Tom Ferry, Tushar Gheewala, Kerry Pierce: ATPG Based on a Novel Grid-Addressable Latch Element. DAC 1991: 282-286 |
1989 | ||
2 | EE | Susheel J. Chandra, Janak H. Patel: Experimental evaluation of testability measures for test generation (logic circuits). IEEE Trans. on CAD of Integrated Circuits and Systems 8(1): 93-97 (1989) |
1987 | ||
1 | EE | Susheel J. Chandra, Janak H. Patel: A Hierarchical Approach Test Vector Generation. DAC 1987: 495-501 |
1 | Tom Ferry | [3] |
2 | Tushar Gheewala | [3] |
3 | Janak H. Patel | [1] [2] |
4 | Kerry Pierce | [3] |