| |
| 2005 | ||
|---|---|---|
| 2 | EE | Shyue Seng Tan, Tu Pei Chen, Chew Hoe Ang, Lap Chan: Mechanism of nitrogen-enhanced negative bias temperature instability in pMOSFET. Microelectronics Reliability 45(1): 19-30 (2005) |
| 1 | EE | Shyue Seng Tan, Tu Pei Chen, Lap Chan: Dynamic NBTI lifetime model for inverter-like waveform. Microelectronics Reliability 45(7-8): 1115-1118 (2005) |
| 1 | Chew Hoe Ang | [2] |
| 2 | Tu Pei Chen | [1] [2] |
| 3 | Shyue Seng Tan | [1] [2] |