Michael Chaine
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2005
1
EE
Michael Chaine,
James Davis
,
Al Kearney
: TLP analysis of 0.125 mum CMOS ESD input protection circuit.
Microelectronics Reliability 45
(2): 223-231 (2005)
Coauthor
Index
1
James Davis
[
1
]
2
Al Kearney
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
