| |
| 2003 | ||
|---|---|---|
| 1 | EE | N. Lucarelli, M. Cavone, M. Muschitiello, D. Centrone, F. Corsi: Thermally Induced Voltage Alteration (TIVA) applied to ESD induced failures. Microelectronics Reliability 43(9-11): 1699-1704 (2003) |
| 1 | M. Cavone | [1] |
| 2 | F. Corsi | [1] |
| 3 | N. Lucarelli | [1] |
| 4 | M. Muschitiello | [1] |