| |
| 2003 | ||
|---|---|---|
| 1 | EE | J. Van de Casteele, D. Laffitte, G. Gelly, C. Starck, M. Bettiati: High reliability level demonstrated on 980nm laser diode. Microelectronics Reliability 43(9-11): 1751-1754 (2003) |
| 1 | M. Bettiati | [1] |
| 2 | G. Gelly | [1] |
| 3 | D. Laffitte | [1] |
| 4 | C. Starck | [1] |