| |
| 1992 | ||
|---|---|---|
| 2 | EE | Michael J. Bryan, Srinivas Devadas, Kurt Keutzer: Necessary and sufficient conditions for hazard-free robust transistor stuck-open-fault testability in multilevel networks. IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 800-803 (1992) |
| 1990 | ||
| 1 | Michael J. Bryan, Srinivas Devadas, Kurt Keutzer: Testability-Preserving Circuit Transformations. ICCAD 1990: 456-459 | |
| 1 | Srinivas Devadas | [1] [2] |
| 2 | Kurt Keutzer | [1] [2] |