| |
| 2006 | ||
|---|---|---|
| 1 | EE | M. Boutillier, O. Gauthier-Lafaye, S. Bonnefont, F. Lozes-Dupuy, F.-J. Vermersch, M. Krakowski, O. Gilard: Strong electron irradiation hardness of 852 nm Al-free laser diodes. Microelectronics Reliability 46(9-11): 1715-1719 (2006) |
| 1 | S. Bonnefont | [1] |
| 2 | O. Gauthier-Lafaye | [1] |
| 3 | O. Gilard | [1] |
| 4 | M. Krakowski | [1] |
| 5 | F. Lozes-Dupuy | [1] |
| 6 | F.-J. Vermersch | [1] |