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A. Bontemps

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1997
1EEM.-N. Sabry, A. Bontemps, V. Aubert, R. Vahrmann: Realistic and efficient simulation of electro-thermal effects in VLSI circuits. IEEE Trans. VLSI Syst. 5(3): 283-289 (1997)

Coauthor Index

1V. Aubert [1]
2M.-N. Sabry [1]
3R. Vahrmann [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)