A. Bontemps
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1997
1
EE
M.-N. Sabry
, A. Bontemps,
V. Aubert
,
R. Vahrmann
: Realistic and efficient simulation of electro-thermal effects in VLSI circuits.
IEEE Trans. VLSI Syst. 5
(3): 283-289 (1997)
Coauthor
Index
1
V. Aubert
[
1
]
2
M.-N. Sabry
[
1
]
3
R. Vahrmann
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
