P. Bojta
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2002
1
EE
P. Bojta,
P. Németh
,
G. Harsányi
: Searching for appropriate humidity accelerated migration reliability tests methods.
Microelectronics Reliability 42
(8): 1213-1218 (2002)
Coauthor
Index
1
G. Harsányi
[
1
]
2
P. Németh
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
